XTDIC-Micro 3D Microstrain Measurement
The XTDIC-Micro microscopic application measurement system combines optical microscopy with DIC digital image correlation technology to meet the needs of nanometer-level precision measurement.
Technical Advantages
- Obtain three-dimensional coordinates, displacement, and full-field strain data.
- 3D visualization of measurement results.
- Suitable for all materials.
- Fast, simple, and high-precision system calibration.
- Freely adjustable measuring area: 1–10 mm.
- Strain measurement range from 0.01% to over 500%.
- Flexible and easy-to-use triggering functions.
Application Scope
- Microstructure and strain analysis at micrometer and nanometer scales.
- Material testing including Young’s modulus, Poisson’s ratio, and elastoplastic properties.
- Strain calculation, elasticity assessment, component size measurement, and nonlinear change detection.
- Advanced materials such as CFRP, wood, PE-containing fibers, metal foam, and rubber.
- Behavior analysis of homogeneous and non-homogeneous materials during deformation.
- Component testing for displacement and strain measurement.
- Microscale dynamic strain measurement such as fatigue testing.
- Biomechanics including bones, muscles, and blood vessels.
- Fracture mechanical property analysis.
- Nonlinear change detection.
Technical parameters
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